Program Committee

Dieter Clement, Consultant (GE)
Al Curran, ThermoAnalytics Inc. (US)
Rami Guissin, DVP Technologies Ltd. (IL)
James C. Jafolla, Surface Optics Corp. (US)
Jean Latger, Oktal SE (FR)
Ingmar Renhorn, FOI (SE)
Endre Repasi, Fraunhofer-IOSB (GE)
Antoine Roblin, ONERA (FR)
Bernard Rosier, ONERA (FR)
David Vaitekunas, W.R. Davis Engineering Ltd. (CA)